回复：[硬盘专家Misha座谈] 为了减少不必要的眼泪...(必读0楼)
囧rz...warning都出来了,看不懂,请求解答
另移动硬盘(I: / H:)用CD指令转不过去-v-?
C:\bin>smartctl -a /dev/hda
smartctl version 5.36 [i686-mingw32-xp-sp2] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K80 family
Device Model: HTS548080M9AT00
Serial Number: MRL485L4HW4AZB
Firmware Version: MG4OA53A
User Capacity: 80,026,361,856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Sun Jun 11 23:02:26 2006
SMART support is: Available - device has SMART capability.
Enabled status cached by OS, trying SMART RETURN STATUS cmd.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off supp
ort.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 55) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_
FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always -
0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline -
0
3 Spin_Up_Time 0x0007 177 177 033 Pre-fail Always -
2
4 Start_Stop_Count 0x0012 082 082 000 Old_age Always -
29727
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always -
0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always -
0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline -
0
9 Power_On_Hours 0x0012 091 091 000 Old_age Always -
4288
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always -
0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always -
954
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always -
0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always -
71
193 Load_Cycle_Count 0x0012 094 094 000 Old_age Always -
60498
194 Temperature_Celsius 0x0002 119 119 000 Old_age Always -
46 (Lifetime Min/Max 5/53)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always -
4
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always -
5
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline -
0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always -
0
SMART Error Log Version: 1
ATA Error Count: 9 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 9 occurred at disk power-on lifetime: 2859 hours (119 days + 3 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 3f fd 5d e0 Error: UNC 8 sectors at LBA = 0x005dfd3f = 6159679
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 3f fd 5d e0 00 00:34:17.500 READ DMA
c8 00 01 00 00 00 e0 00 00:34:17.500 READ DMA
c8 00 80 3f fd 5d e0 00 00:34:13.500 READ DMA
c8 00 08 df 0c 61 e0 00 00:34:13.500 READ DMA
c8 00 08 df 0c 61 e0 00 00:34:13.500 READ DMA
Error 8 occurred at disk power-on lifetime: 2859 hours (119 days + 3 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 3f fd 5d e0 Error: UNC 128 sectors at LBA = 0x005dfd3f = 6159679
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 3f fd 5d e0 00 00:34:13.500 READ DMA
c8 00 08 df 0c 61 e0 00 00:34:13.500 READ DMA
c8 00 08 df 0c 61 e0 00 00:34:13.500 READ DMA
ca 00 08 df 0c 61 e0 00 00:34:13.500 WRITE DMA
40 00 08 df 0c 61 e0 00 00:34:13.400 READ VERIFY SECTOR(S)
Error 7 occurred at disk power-on lifetime: 2859 hours (119 days + 3 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 37 fd 5d e0 Error: UNC 8 sectors at LBA = 0x005dfd37 = 6159671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 37 fd 5d e0 00 00:34:09.600 READ DMA
c8 00 01 00 00 00 e0 00 00:34:09.600 READ DMA
c8 00 80 37 fd 5d e0 00 00:34:05.500 READ DMA
c8 00 08 57 0c 61 e0 00 00:34:05.500 READ DMA
c8 00 80 af fc 5d e0 00 00:34:05.500 READ DMA
Error 6 occurred at disk power-on lifetime: 2859 hours (119 days + 3 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 37 fd 5d e0 Error: UNC 128 sectors at LBA = 0x005dfd37 = 6159671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 37 fd 5d e0 00 00:34:05.500 READ DMA
c8 00 08 57 0c 61 e0 00 00:34:05.500 READ DMA
c8 00 80 af fc 5d e0 00 00:34:05.500 READ DMA
c8 00 80 2f fc 5d e0 00 00:34:05.500 READ DMA
c8 00 80 af fb 5d e0 00 00:34:05.500 READ DMA
Error 5 occurred at disk power-on lifetime: 2859 hours (119 days + 3 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 31 fd 5d e0 Error: UNC 6 sectors at LBA = 0x005dfd31 = 6159665
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 2f fd 5d e0 00 00:34:01.500 READ DMA
c8 00 01 00 00 00 e0 00 00:34:01.500 READ DMA
c8 00 80 2f fd 5d e0 00 00:33:57.300 READ DMA
c8 00 80 af fc 5d e0 00 00:33:56.500 READ DMA
c8 00 80 2f fc 5d e0 00 00:33:56.500 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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